Analysis of Extended X-Ray Absorption Fine Structure (EXAFS) Data Using Artificial Intelligence Techniques

Authors

Jeff Terry
Miu Lun Lau
Jiateng Sun
Chang Xu
Bryan Hendricks
Julia Kise
Mrinalini Lnu
Sanchayni Bagade
Shail Shah
Priyanka Makhijani
Adithya Karantha
Travis Boltz
Max Oellien
Matthew Adas
Shlomo Argamon, Touro UniversityFollow
Min Long
Donna Post Guillen

Roles

Author

Document Type

Article

Publication Date

1-1-2021

Journal Title

Applied Surface Science

DOI

10.1016/j.apsusc.2021.149059

Recommended Citation

Terry, J., Lau, M. L., Sun, J., Xu, C., Hendricks, B., Kise, J., Lnu, M., Bagade, S., Shah, S., Makhijani, P., Karantha, A., Boltz, T., Oellien, M., Adas, M., Argamon, S., Long, M., & Guillen, D. P. (2021). Analysis of Extended X-Ray Absorption Fine Structure (EXAFS) Data Using Artificial Intelligence Techniques. Applied Surface Science, 547, 149059. https://doi.org/10.1016/j.apsusc.2021.149059